Posts Tagged ‘nanoelectronics’

Today I read paper by Xinwei Deng from University of Wisconsin-Madison titled “Applications of statistical
quantification techniques in nanomechanics and nanoelectronics”. You can download the paper from here.

In the paper Deng talks about the infeasibility of standard characterization methods in nanoscale. For example ordinary tensile strength test cannot be done at the nanoscale, because you material cannot be clamped by the holder without sliding.

Deng argues that statistical methods can be better alternative, and demonstrates his idea in two areas: nanomechanics and nanoelectronics.

Other two related papers are:

Statistical approach to quantifying the elastic deformation of nanomaterials

Quantifying the elastic deformation behavior of bridged nanobelts

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Tao Yuan was the chair of Reliability and Statistics Related to Nanotechnology at INFORMS 2009 San Diego conference. Today I found out that Yuan is doing interdisciplinary research with Yue Kuo. NSF awarded them 206229 $, their project title is “Nonparametric Bayesian Modeling of Reliability of Nanoelectronics “. Research has both theoretical and experimental sides. Quoting from NSF website:

Upon the successful completion of this project, new methods and tools that are critical to design and manufacture reliable nanoelectronic products will be developed. This will be the first systematic study in modeling and predicting reliability of nano products based on experimental data and nonparametric Bayesian methods which offer great flexibility and capability to address challenges in real products influencing yield and cost.

Tao Yuan previously did research on applying bayesian  analysis for determining defect rates in electronic devices.  Here is a related article. Now he will use his expertise in nanoelectronics.

Note: I will update this post, as Yuan publishes new articles.

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