Posts Tagged ‘informs’

Nanotechnology at INFORMS 2010

INFORMS 2010 was held in Austin, Texas between 7-10 November 2010. Like in 2009, I looked at nanotechnology related sessions, and made a list of OR people working in nanotechnology. Community got bigger this year.

Sunday (7 November 2010)

  • Paul Goethals, Byung Rae Cho The Application of Higher-order Polynomial Models to Nanoparticle Manufacturing
  • Richard WyskProduced in the U.S. using Nano Manufacturing
  • Elsayed ElsayedReliability Modeling and Prediction of Ultra-thin Diodes
  • Jianjun ShiIn-Situ Process Control for Nanopowder Scale-up Production
  • Satish BukkapatnamNSF Workshop on Sensing and Prognostics Issues in Nanomanufacturing
  • Binil StarlyModeling of Near Field Electrospinning Process using Response Surface Methodology
  • Igor LinkovValue for Information for Prioritizing Nano-related Research

Special nanotechnology sessions:

“Nanotechnology & Nanoinformatics I”

Chair: Qiang Huang, Co-Chair: Tirthankar Dasgupta

  • Chia-Jung ChangQuantitative Characterization and Modeling of Nanoparticle Dispersion in Polymer Composite
  • Lijuan Xu Modeling the Interaction Among Nanostructures for Local Morphology Control
  • Xu XuSequential Synthesis of Nanomaterials via Level Expansion
  • Chiwoo Park – A Statistical Method for Analyzing the Morphology of Nanoparticles


“Nanotechnology & Nanoinformatics II”

Chair: Qiang Huang, Co-Chair: Tirthankar Dasgupta

  • Xinwei DengA Statistical Approach to Modeling the Potential Data in Nanoquantification
  • Li Wang – Hierarchical Modeling of Weight Kinetics of Silica Nanowire Growth under Different Temperatures
  • Jye Chyi Lu – The Constrained Random Effect Models for Nanoparticle Synthesis
  • Tao Yuan – Nonparametric Bayesian Modeling of Hazard Rate with Change-point for Nanoelectronic Devices


Monday (8 November 2010)

“Quality and Reliability in Nano-scale Systems”

Chair: Abe Zaid, Co-Chair: Sagar Kamarthi

  • Marcus B. Perry – Statistical Characterization of Nanostructured Surfaces Created by Machining Processes
  • Wilkistar OtienoNonparametric CMOS Dielectric Failure Time Distribution Estimation Using Kernel Density Estimation M


Tuesday (9 November 2010)

  • Erhun Kundakçıoğlu – Support Vector Machines for Toxicological Evaluation of Nanoparticles
  • Claudia SchoonhovenFrom Science & Technology Creation to Emergence of Dedicated Nanotechnology Population 1970-2004

Special nanotechnology session

“Nanomanufacturing & Nanoinformatics III”

Chair: Qiang Huang

  • Sagar Kamarthi – Statistical and Experimental Design Methods for Quality Assurance in Carbon Nanotube Production
  • Satish BukkapatnamAtomistic Simulation-based prediction of carbon nanotube (CNT) growth in Microwave CVD process


Wednesday (10 November 2010)

  • Tyler Wry – To Build or Break Away? Exploring the Antecedents of Category Spanning Nanotechnology Innovation


All abstracts can be read at INFORMS 2010 conference website. Binil Starly’s paper is the most relevant one to my research. I will try to get more information about that paper.

What do you think will the situation be in 2011?


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Tao Yuan was the chair of Reliability and Statistics Related to Nanotechnology at INFORMS 2009 San Diego conference. Today I found out that Yuan is doing interdisciplinary research with Yue Kuo. NSF awarded them 206229 $, their project title is “Nonparametric Bayesian Modeling of Reliability of Nanoelectronics “. Research has both theoretical and experimental sides. Quoting from NSF website:

Upon the successful completion of this project, new methods and tools that are critical to design and manufacture reliable nanoelectronic products will be developed. This will be the first systematic study in modeling and predicting reliability of nano products based on experimental data and nonparametric Bayesian methods which offer great flexibility and capability to address challenges in real products influencing yield and cost.

Tao Yuan previously did research on applying bayesian  analysis for determining defect rates in electronic devices.  Here is a related article. Now he will use his expertise in nanoelectronics.

Note: I will update this post, as Yuan publishes new articles.

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Nanotechnology at INFORMS 2009

This year annual INFORMS conference was held in San Diego between 11-14 October 2009. After the conference program was announced, I immediately looked for nanotechnology related sessions. Here are they:

MA07 – Reliability and Statistics related to Nanotechnology

TA07 – Quality Control for Nanomanufacturing

TB05 – Panel Discussion: Quality Improvement in Nanomanufacturing

TB07 – Quality and Reliability in Nanomanufacturing

WC72 – Nanotechnology

WD06 – Panel Discussion Session: Challenges and Opportunities in Nanomanufacturing Process Modeling and Control

It is interesting that except one, all nanotechnology sessions are related with quality control topics.

I used Twitter to reach someone, who had a more detailed session index, and get speaker names. Hopefully @razzzat sent me relevant information. I want to thank him also here in this blog post.

Here is the speaker list:

MA 07 – Jye-Chyi Lu, Tongdan Jin, Wilkistar Otieno, Chia-Han Yang (I could not find Yang’s university website), Tao Yuan.

TA 07 – Paul Kvam, Chiwoo Park, Qiang Huang, Tirthankar Dasgupta, Jye-Chyi Lu.

TB05 – Chair: Qiang Huang, Panel: C. F. Jeff Wu (I read his papers before this conference, I think that he is the most experienced one in this field), Chuck Zang. (I could not find Zang’s university website)

TB07 – Arda Vanli, Sagar Kamarthi, James Watkins.

WC72 – Zeynep Ok.

WD06 – Qiang Huang.

I think this list will be a good starting point for exploring current OR research in nanotechnology.

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